Advanced x-ray imaging spectrometer

Details Advanced x-ray imaging spectrometer Advanced x-ray imaging spectrometer

1996-11-08

1998-05-26

Wong, Don

Radiant energy

Invisible radiant energy responsive electric signalling

With or including a luminophor

G01T 1161

Patent

active

057570051

ABSTRACT:
An x-ray spectrometer that also provides images of an x-ray source. Coded aperture imaging techniques are used to provide high resolution images. Imaging position-sensitive x-ray sensors with good energy resolution are utilized to provide excellent spectroscopic performance. The system produces high resolution spectral images of the x-ray source which can be viewed in any one of a number of specific energy bands.

REFERENCES:
patent: 4209780 (1980-06-01), Fenimore et al.
patent: 5245191 (1993-09-01), Barber et al.
Fenimore, E.E. and Cannon, T.M., "Coded aperture imaging with uniformly redundant arrays", Feb. 1, 1978, Applied Optics, vol. 17, No. 3, pp. 7-347.
Ludewigt, J., et al., "A High Rate, Low Noise, X-Ray Silicon Strip Detector System", Aug. 1994, IEEE Transactions on Nuclear Science, vol. 41, No. 4, pp. 1037-1041.
S. Holland, "Fabrication of Detectors and Transistors on High Resistivity Silicon", Mar. 1989, Nucl. Instr. Meth., vol. A275, pp. 537-541.

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