Advanced signal process for a material storage measuring device

Details Advanced signal process for a material storage measuring device Advanced signal process for a material storage measuring device

1997-05-20

1999-12-07

Patel, Harshad

Measuring and testing

Liquid level or depth gauge

G01F 2300

Patent

active

059964065

ABSTRACT:
An advanced signal processing technique accurately discriminates and estimates a small sinusoidal signal in close proximity from one or more large sinusoidal signals. The technique involves using digital processing techniques to accurately estimate the frequency (96), amplitude (94) and phase (98) of the one or more large sinusoids and then using this estimate to obtain an accurate estimate of the small sinusoidal signal by subtracting the large sinusoid from the data to obtain a residual and reprocessing the residual.

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James A. Cadzow, Senior Member, IEEE, "Spectral Estimation: An Overdetermined Rational Model Equation Approach", Proceedings of the IEEE, vol. 70, No. 9, Sep. 1982.
John M. M. Anderson, Georgios B. Giannakis, and Ananthram Swami, Members of the IEEE, "Harmonic Retrieval Using Higher Order Statistics: A Deterministic Formulation", IEEE Transactions on Signal Processing, vol. 43, No. 8, Aug. 1995.

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