Advanced polarization imaging method, apparatus, and...

Optics: measuring and testing – By polarized light examination

Reexamination Certificate

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C356S365000, C356S369000

Reexamination Certificate

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07612880

ABSTRACT:
A method, apparatus, and computer program product for identifying features in a sample by analyzing Mueller matrices to calculate an average degree of polarization, a weighted average degree of polarization, a degree of polarization map, a degree of polarization surface. Also, a method, apparatus, and computer program product for identifying features in a sample by analyzing Mueller matrices to calculate depolarization relative to a retardance axis and/or a diattentuation axis, and to calculate a ratio of diattenuation to polarizance or ratios of row and column magnitudes. Also, a method for retinal polarimetry, including a non-depolarizing light tube configured for insertion into the eye.

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patent: 6384916 (2002-05-01), Furtak
patent: 6927888 (2005-08-01), Garcia et al.
patent: 7287855 (2007-10-01), Zhou et al.

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