Advanced lateral overflow drain antiblooming structure for virtu

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

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257223, 257230, 257243, H01L 2978

Patent

active

054536324

ABSTRACT:
The lateral overflow drain for virtual phase devices includes: a semiconductor region 72 of a first conductivity type; a drain region 24 of the first conductivity type formed in the semiconductor region 72; a threshold adjust region 22 formed in the semiconductor region 72 and surrounding the drain region 24; an electrode 20 overlying and connected to the drain region 24, the electrode 20 overlying and separated from at least a portion of the threshold adjust region 22; and virtual gates 30 and 32 of the second conductivity type in the semiconductor region 72 spaced apart from the drain region 24 and partially surrounding the drain region 24.

REFERENCES:
patent: 5151380 (1992-09-01), Hynecek
patent: 5286990 (1994-02-01), Hynecek
patent: 5341008 (1994-08-01), Hynecek
A Channel-Stop Defined Barrier and Drain Antiblooming Structure for Virtual Phase CCD Image Sensors, W. F. Keenan, et al., IEEE Transaction on Electron Devices, vol. No. 36, Sep. 1989.

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