Advanced cable metrology system

Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination

Reexamination Certificate

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Details

C702S040000

Reexamination Certificate

active

11000631

ABSTRACT:
The present invention is a method for determining the center to center spacing of conductors in an insulated, multi-conductor, flat cable. The method comprising applying an X-ray field to the cable, detecting the X-ray field intensity that passes through the cable, obtaining a digitized output waveform of the X-ray field intensity as a function of cable position, and determining a trough location of the waveform by averaging calculated position values for the center of the conductor at several longitudinal positions along a cross section of the conductor.

REFERENCES:
patent: 4688241 (1987-08-01), Peugeot
patent: 5010564 (1991-04-01), Thomas
patent: 6649914 (2003-11-01), Moorman et al.
patent: 2004/0184575 (2004-09-01), Sikora
patent: 2005/0094763 (2005-05-01), Sherman et al.
patent: 0 227 350 (1987-07-01), None
“X-ray Measurement System” Industrial Measurement Systems, Inc. USA [on line], copyright 2004 Industrial Measurements Systems Inc., [retrieved from the internet on Aug. 16, 2004]. URL <http://www.imsysinc.com/ADMS1.htm>.
Memo titled “X-Ray Inspection System for Cable” dated Dec. 19, 1983.
Memo titled “Magnaflux On-Line Cable Acceptance” dated Sep. 12, 1986.
Proposal prepared for 3M Corporation dated Feb. 29, 1984.
Memo titled “Flat Cable Measurement” dated Apr. 29, 1983.
MAXIS 2.0 System Documentation dated Apr. 1993.
User Manual, MX 5862, Magnaflux Automatic X-Ray Inspection System (MAXIS), Magnaflux Advanced Research Laboratory, 2301 Arthur, Elk Grove Village, IL 60007.

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