Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Reexamination Certificate
2007-03-13
2007-03-13
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Dimensional determination
C702S040000
Reexamination Certificate
active
11000631
ABSTRACT:
The present invention is a method for determining the center to center spacing of conductors in an insulated, multi-conductor, flat cable. The method comprising applying an X-ray field to the cable, detecting the X-ray field intensity that passes through the cable, obtaining a digitized output waveform of the X-ray field intensity as a function of cable position, and determining a trough location of the waveform by averaging calculated position values for the center of the conductor at several longitudinal positions along a cross section of the conductor.
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patent: 6649914 (2003-11-01), Moorman et al.
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patent: 2005/0094763 (2005-05-01), Sherman et al.
patent: 0 227 350 (1987-07-01), None
“X-ray Measurement System” Industrial Measurement Systems, Inc. USA [on line], copyright 2004 Industrial Measurements Systems Inc., [retrieved from the internet on Aug. 16, 2004]. URL <http://www.imsysinc.com/ADMS1.htm>.
Memo titled “X-Ray Inspection System for Cable” dated Dec. 19, 1983.
Memo titled “Magnaflux On-Line Cable Acceptance” dated Sep. 12, 1986.
Proposal prepared for 3M Corporation dated Feb. 29, 1984.
Memo titled “Flat Cable Measurement” dated Apr. 29, 1983.
MAXIS 2.0 System Documentation dated Apr. 1993.
User Manual, MX 5862, Magnaflux Automatic X-Ray Inspection System (MAXIS), Magnaflux Advanced Research Laboratory, 2301 Arthur, Elk Grove Village, IL 60007.
Foster Keith H.
Schneider Patrick
Voth James H.
Yuhas Donald E.
3M Innovative Properties Company
Barlow John
Gover Melanie G.
Moffat Jonathan
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