Adjustment of avalanche voltage in DIFMOS memory devices by cont

Metal working – Method of mechanical manufacture – Assembling or joining

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148 15, 148187, B01J 1700

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active

041319834

ABSTRACT:
A dual injector, floating-gate MOS non-volatile semiconductor memory device (DIFMOS) has been fabricated, wherein the electron injection means comprises a p+n+ junction, the n+ region thereof having a critical dopant concentration, controlled by ion implantation. The junction is avalanched to "write" a charge on the floating gate, and a hole injector junction (n+/p-) is avalanched to "erase" the charge. An MOS sensing transistor, whose gate is an extension of the floating gate, "reads" the presence or absence of charge on the floating gate. In a preferred embodiment, the hole injection means includes an MOS "bootstrap" capacitor for coupling a voltage bias to the floating gate.

REFERENCES:
patent: 3881180 (1975-04-01), Gosney

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