Adjustment method, exposure method, device manufacturing...

Radiation imagery chemistry: process – composition – or product th – Including control feature responsive to a test or measurement

Reexamination Certificate

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Reexamination Certificate

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07955765

ABSTRACT:
An adjustment method for adjusting an illumination condition in illuminating an original plate using an illumination optical system and projecting an image of a pattern formed on the original plate onto a substrate through a projection optical system includes measuring a polarization state of light that has passed through the illumination optical system, the original plate, and the projection optical system in a state where the original plate is located on an object plane of the projection optical system, and adjusting the polarization state based on the measured polarization state.

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patent: 6768546 (2004-07-01), Sato
patent: 7245356 (2007-07-01), Hansen
patent: 7643137 (2010-01-01), Sugihara et al.
patent: 2003/0038937 (2003-02-01), Sato
patent: 2007/0046922 (2007-03-01), Kadono
patent: 11-317349 (1999-11-01), None
patent: 2007-059566 (2007-03-01), None
patent: 2007-188927 (2007-07-01), None
patent: 10-2004-0005709 (2004-01-01), None

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