Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-05-06
2008-05-06
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090
Reexamination Certificate
active
07368930
ABSTRACT:
A probe card assembly can comprise a support structure to which a plurality of probes can be directly or indirectly attached. The probes can be disposed to contact an electronic device to be tested. The probe card assembly can further comprise actuators, which can be configured to change selectively an attitude of the support structure with respect to a reference structure. The probe card assembly can also comprise a plurality of lockable compliant structures. While unlocked, the lockable compliant structures can allow the support structure to move with respect to the reference structure. While locked, however, the compliant structures can provide mechanical resistance to movement of the support structure with respect to the reference structure.
REFERENCES:
patent: 5828225 (1998-10-01), Obikane et al.
patent: 6078186 (2000-06-01), Hembree et al.
patent: 6509751 (2003-01-01), Mathieu et al.
patent: 6586956 (2003-07-01), Aldaz et al.
patent: 6677771 (2004-01-01), Zhou et al.
patent: 6774651 (2004-08-01), Hembree
patent: 6784678 (2004-08-01), Pietzschmann
patent: 7071715 (2006-07-01), Shinde et al.
patent: 7074072 (2006-07-01), Huebner
patent: 7075319 (2006-07-01), Mori
patent: 7255575 (2007-08-01), Hasegawa
patent: 7262611 (2007-08-01), Mathieu et al.
patent: 2004/0061515 (2004-04-01), Chang et al.
patent: 2004/0113643 (2004-06-01), Kawaguchi et al.
patent: 2004/0266089 (2004-12-01), Mathieu et al.
U.S. Appl. No. 09/527,931, filed Mar. 17, 2000, Mathieu et al.
Hobbs Eric D.
McCoy Christopher D.
Porter, Jr. James M.
Slocum Alexander H.
Burraston N. Kenneth
FormFactor Inc.
Isla-Rodas Richard
Nguyen Ha Tran
LandOfFree
Adjustment mechanism does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Adjustment mechanism, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Adjustment mechanism will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2773371