Adjustment for reflective surfaces in interferometers

Details Adjustment for reflective surfaces in interferometers Adjustment for reflective surfaces in interferometers

1985-03-20

1987-06-09

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

G01B 902

Patent

active

046716564

ABSTRACT:
There is disclosed an adjustment structure for use in initially aligning the two arms of an interferometer, by varying slightly the angular position of mirror surfaces. Two "wedge" elements are used behind the mirror, each of which is independently rotatable about an axis perpendicular to the face of the mirror. In order to provide ideal lubrication between the relatively movable flat engaging surfaces, a solid layer of a low friction polymer is used, preferably polytetrafluoroethylene.

REFERENCES:
patent: 3936193 (1976-02-01), Auth
patent: 3955788 (1976-05-01), Delage
patent: 4021101 (1977-05-01), Camerik
patent: 4316651 (1982-02-01), Hosken

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