Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-07-20
2009-02-17
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C700S299000, C331S066000
Reexamination Certificate
active
07493229
ABSTRACT:
A mechanism for utilizing a single set of one or more thermal sensors, e.g., thermal diodes, provided on the integrated circuit device, chip, etc., to control the operation of the integrated circuit device, associated cooling system, and high-frequency PLLs is provided. By utilizing a single set of thermal sensors to provide multiple functions, e.g., controlling the operation of the integrated circuit device, the cooling system, and the PLLs, silicon real-estate usage is reduced through combining circuitry functionality. Moreover, the integrated circuit device yield is improved by reducing circuitry complexity and increasing PLL robustness to temperature. Furthermore, the PLL circuitry operating range is improved by compensating for temperature.
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Boerstler David W.
Chadwick Nathaniel R.
Hailu Eskinder
Peterson Kirk D.
Qi Jieming
Baran Mary C
Feliciano Eliseo Ramos
International Business Machines - Corporation
Talois Matthew B.
Walder, Jr. Stephen J.
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