Adjusting voltage for a phase locked loop based on temperature

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system

Reexamination Certificate

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C700S299000, C331S066000

Reexamination Certificate

active

07493229

ABSTRACT:
A mechanism for utilizing a single set of one or more thermal sensors, e.g., thermal diodes, provided on the integrated circuit device, chip, etc., to control the operation of the integrated circuit device, associated cooling system, and high-frequency PLLs is provided. By utilizing a single set of thermal sensors to provide multiple functions, e.g., controlling the operation of the integrated circuit device, the cooling system, and the PLLs, silicon real-estate usage is reduced through combining circuitry functionality. Moreover, the integrated circuit device yield is improved by reducing circuitry complexity and increasing PLL robustness to temperature. Furthermore, the PLL circuitry operating range is improved by compensating for temperature.

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