Adjusting programming or erase voltage pulses in response to...

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S185180, C365S185230

Reexamination Certificate

active

07633804

ABSTRACT:
Memory devices and methods of operating memory devices are provided. In one such embodiment a programming voltage pulse or an erase voltage pulse is applied to memory cells of a memory device. A number of the memory cells that failed to program or erase is determined and is compared to a certain number that can be different than a number of memory cells to be programmed or erased. The programming voltage pulse or the erase voltage pulse is adjusted in response to the comparison of the number of memory cells that failed to program or erase to the certain number. The adjusted programming voltage pulse or the adjusted erase voltage pulse is applied to the memory cells that failed to program or erase.

REFERENCES:
patent: 5453737 (1995-09-01), Opoczynski
patent: 7239557 (2007-07-01), Ha
patent: 7564718 (2009-07-01), Seidel et al.
patent: 2009/0073772 (2009-03-01), Ha
K. Suh, et al. “A 3.3 V 32 Mb NAND Flash Memory with Incremental Step Pulse Programming Scheme” IEEE Journal of Solid-State Circuits, vol. 30, No. 11, Nov. 1995 pp. 1149-1156.

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