Adjusting program and erase voltages in a memory device

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S185170, C365S185180, C365S185290

Reexamination Certificate

active

07952927

ABSTRACT:
A method and apparatus for adjusting threshold program and erase voltages in a memory array, such as a floating gate memory array, for example. A method includes applying a first voltage level to a first edge word line of a memory block string and applying a second voltage level to a second edge word line of the memory block string. The method might also include applying a third voltage level to non-edge word lines of the memory block string.

REFERENCES:
patent: 6954380 (2005-10-01), Ono et al.
patent: 7061813 (2006-06-01), Lee
patent: 7092292 (2006-08-01), Mokhlesi et al.
patent: 7310280 (2007-12-01), Park et al.
patent: 7403421 (2008-07-01), Mokhlesi et al.
patent: 7539061 (2009-05-01), Lee
patent: 2006/0256622 (2006-11-01), Aritome
patent: 2006/0262606 (2006-11-01), Aritome
patent: 2006/0262607 (2006-11-01), Aritome
patent: 2007/0030737 (2007-02-01), Aritome
patent: 2007/0047307 (2007-03-01), Ogura et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Adjusting program and erase voltages in a memory device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Adjusting program and erase voltages in a memory device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Adjusting program and erase voltages in a memory device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2635014

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.