Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2005-05-17
2008-10-07
Nguyen, Ha (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
C356S432000
Reexamination Certificate
active
07432701
ABSTRACT:
An adjusting device with a mounting fixture (4) for mounting a wafer (2) on a mounting side (4a) of the mounting fixture (4), whereby the mounting fixture has at least one through-hole (5) directed essentially orthogonal to the mounting side (4a), is characterised in that the through-hole (5) on the mounting side (4a) has a smaller cross-section than on the entrance side (4b) of the through-hole (5) facing away from the mounting side (4a).
REFERENCES:
patent: 4541717 (1985-09-01), Itamoto et al.
patent: 4922277 (1990-05-01), Carlson et al.
patent: 5549756 (1996-08-01), Sorensen et al.
patent: 5572398 (1996-11-01), Federlin et al.
patent: 6299713 (2001-10-01), Bejtlich
patent: 2002/0113056 (2002-08-01), Sugaya et al.
patent: 20309051 (2003-06-01), None
patent: 0269076 (1987-11-01), None
patent: 1047116 (2000-10-01), None
patent: 2 170 651 (1986-08-01), None
patent: 58202543 (1983-11-01), None
patent: 6151553 (1994-05-01), None
patent: WO 98/14999 (1998-04-01), None
Austrian Search Report—1 page.
Kusner & Jaffe
Nguyen Ha
Nguyen Trung Q
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