Adjustable quick-mount test probe assembly

Details Adjustable quick-mount test probe assembly Adjustable quick-mount test probe assembly

1987-12-02

1989-02-21

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 106

Patent

active

048068560

ABSTRACT:
An adjustable quick-mount test probe assembly for use in circuit testing. The test probe assembly provides a convenient means for testing printed circuit boards containing Very Large Scale Integrated (VLSI) components and high density interconnect substrates. This is due to its versatility in terms of positioning and its use of replaceable, "off-the-shelf" test probe tips. The test probe assembly provides a means of quickly connecting test clips from a test equipment unit to a circuit board, as well as providing a means of neatly arranging test leads to avoid the possibility of entanglement and reducing strain on the test probe. Test set-up time is greatly reduced, and confidence of test set-up integrity is increased.

REFERENCES:
patent: 2825871 (1958-04-01), Evans
patent: 3345567 (1967-10-01), Turner et al.
patent: 3437929 (1969-04-01), Glenn
patent: 3590372 (1971-06-01), De Santis et al.

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