Adjustable probe for probe assembly

Details Adjustable probe for probe assembly Adjustable probe for probe assembly

1989-11-08

1990-11-27

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158F, 439482, G01R 3102, G01R 106

Patent

active

049739034

ABSTRACT:
An adjustable probe to be utilized in probe card technology during the multiprobe electrical testing of integrated circuits. The adjustable probe includes a pair of slots for expansion/contraction and adjustment to obtain a high degree of planarization and placement accuracy of the probe needle.

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patent: 4151465 (1979-04-01), Lenz
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patent: 4267507 (1981-05-01), Guerpont
patent: 4599559 (1986-07-01), Evans
patent: 4618821 (1986-10-01), Lenz

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