Adjustable low inductance probe

Details Adjustable low inductance probe Adjustable low inductance probe

1989-10-02

1990-05-08

Paumen, Gary F.

Electrical connectors

With circuit conductors and safety grounding provision

439482, 439 98, 324 725, 324158P, H01R 466, H01R 1188

Patent

active

049234072

ABSTRACT:
A low inductance probe contains a signal probe shaft having a signal probe point and an adjacent ground conductor or conductive shield for placing on the circuit location which is desired to be measured, a ground probe arm having a ground probe point for placing on a convenient ground location. The ground probe arm is attached to the signal probe shaft by means of a hinge which enable the ground probe arm to rotate between zero and approximately 135 degrees in a compass like fashion. The ground conductor of the signal probe shaft and the ground probe point of the ground probe arm are electrically connected by means of a low inductance ground lead consisting of a monolithic, flexible strand of conductive foil.

REFERENCES:
patent: 2912647 (1959-11-01), Krystek
patent: 3265969 (1966-08-01), Catu
patent: 4838802 (1989-06-01), Soar
"Scope Probe", IBM Technical Disclosure Bulletin, vol. 7, No. 5, Oct. 1964.

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