Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen
Patent
1996-11-20
1997-11-11
Dougherty, Elizabeth L.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
By loading of specimen
G02N 308
Patent
active
056866704
ABSTRACT:
A fixture for use with a wire pull tester that tests the strength of a bond between an electrical contact of a semiconductor device and a wire affixed to the electrical contact. The fixture comprises a device support, a mounting surface provided on the device support, and a port provided at the mounting surface. The device support includes a height adjustment mechanism. The mounting surface is configured to engage a surface of the semiconductor device and includes a port with which an air pressure differential is produced to maintain engagement between the mounting surface and the semiconductor device surface when a pull force provided by a wire pulling member of the tester is imparted to the wire affixed to the electrical contact of the semiconductor device.
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Dougherty Elizabeth L.
VLSI Technology Inc.
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