Adjustable echelle spectrometer arrangement and method for its a

Details Adjustable echelle spectrometer arrangement and method for its a Adjustable echelle spectrometer arrangement and method for its a

1988-03-11

1989-08-15

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356332, 356334, G01J 318

Patent

active

048568988

ABSTRACT:
An adjustable Echelle spectrometer arrangement which can be used in single- and multi-element analysis by the emission or absorption of optical radiation. To compensate all the manufacturing and setup errors, the only arrangements present are those to change the height of the entry slit arrangement above the base plate and to rotate the dispersion prism about a first axis, approximately parallel to its roof edge, and about a second axis, that is vertical thereto. This compensates for the effect of errors associated with component and setup parameters which results from greater tolerances, without impairing mechanical and thermal stability and imaging quality.

REFERENCES:
patent: 3658424 (1972-04-01), Elliott
patent: 4690559 (1987-09-01), Florek et al.

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