Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2005-05-10
2008-12-09
Jiang, Chen-Wen (Department: 3744)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S130000, C700S299000, C713S300000, C062S259200
Reexamination Certificate
active
07463993
ABSTRACT:
Systems and methods of thermal management provide for dynamically the upper and lower operating points of a throttled device such as a processor. In one embodiment, it is determined that the temperature of the processor is below a threshold and moving the upper operating point and the lower operating point toward one another.
REFERENCES:
patent: 5825674 (1998-10-01), Jackson
patent: 2002/0143488 (2002-10-01), Cooper et al.
patent: WO 2004/036398 (2004-04-01), None
patent: WO-2004036398 (2004-04-01), None
PCT International Search Report, International Application No. PCT/US2006/016671, International filing date Apr. 28, 2006, mailing date May 7, 2007.
Cohen Aviad
Finkelstein Lev
Lamdan Oren
Rotem Efraim
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Jiang Chen-Wen
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