Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1987-11-24
1989-09-12
Sikes, William L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
250201, G01B 902
Patent
active
048654540
ABSTRACT:
An adaptive optical system with local wavefront sensing and control interferometrically determines wavefront phase aberration in an incoming electromagnetic beam and adjusts the reflective surface of a deformable mirror. The system is characterized by wavefront phase sensing local to the deformable mirror and detection apparatus which synchronously detects phase differences between an interferometrically modulated beam and a uniform modulator.
REFERENCES:
patent: 3495893 (1970-02-01), Geusic et al.
patent: 3507564 (1970-04-01), Franks
patent: 3857636 (1974-12-01), Angelbeck
patent: 4030831 (1977-06-01), Gowrinathan
Lazzarini Albert J.
Ulich Bobby L.
Kaman Aerospace Corporation
Koren Matthew W.
Sikes William L.
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