Adaptive operations for nonvolatile memories

Static information storage and retrieval – Floating gate – Particular biasing

Reexamination Certificate

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C365S185180, C365S185280

Reexamination Certificate

active

07656710

ABSTRACT:
Adaptive write operations for non-volatile memories select programming parameters according to monitored programming performance of individual memory cells. In one embodiment of the invention, programming voltage for a memory cell increases by an amount that depends on the time required to reach a predetermined voltage and then a jump in the programming voltage is added to the programming voltage required to reach the next predetermined voltage. The adaptive programming method is applied to the gate voltage of memory cells; alternatively, it can be applied to the drain voltage of memory cells along a common word line. A circuit combines the function of a program switch and drain voltage regulator, allowing independent control of drain voltage of selected memory cells for parallel and adaptive programming. Verify and adaptive read operations use variable word line voltages to provide optimal biasing of memory and reference cells during sensing.

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Giovanni Campardo, et al., “40-mm2 3-V-Only 50-MHz 64-Mb 2-v/Cell CHE NOR Flash Memory”, IEEE Journal of Solid-State Circuits, Nov. 2000, vol. 35, No. 11.

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