Optics: measuring and testing – Of light reflection
Reexamination Certificate
2009-08-04
2011-10-25
Ton, Tri T (Department: 2877)
Optics: measuring and testing
Of light reflection
C356S448000
Reexamination Certificate
active
08045173
ABSTRACT:
A method for linear filtering of noise in a SPR sensorgram generated from a surface plasmon resonance apparatus is provided. The method includes providing a linear filter of variable length to filter an output signal in the sensorgram. The method further includes determining an optimal length of the linear filter based on a slope of the signal in the sensorgram and multiple timing of occurrences of events during measurement of refractive index in the apparatus to reduce noise in the sensorgram.
REFERENCES:
patent: 7012694 (2006-03-01), Ivarsson
patent: 7230714 (2007-06-01), Barford et al.
patent: 7251085 (2007-07-01), Bahatt et al.
patent: 97/15819 (1997-05-01), None
General Electric Company
Haeckl Jenifer E.
Ton Tri T
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