Adaptive fault identification system

Excavating

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

371 161, 395 20, 395575, 395911, 395916, G06F 1518

Patent

active

053512472

ABSTRACT:
An adaptive fault identification system identifies repeat faults by capturing data representative of a fault. The captured data is subjected to a search tool and compared to data that is known to represent faults, and if possible, the unknown fault is identified. The search tool does not need to exactly match the data representing the unknown fault to the stored data. Instead, if the recall data pattern is similar enough to some of the stored data, a list of labels is returned where each label points to a recommended corrective action. By employing a learning algorithm, the similarity comparisons can be adapted to reflect greater knowledge of faults so that more accurate similarity comparisons can be made.

REFERENCES:
patent: 3976864 (1976-08-01), Gordon et al.
patent: 4084260 (1978-04-01), Fleming et al.
patent: 4434489 (1984-02-01), Blyth
patent: 4709366 (1987-11-01), Scott et al.
patent: 4757463 (1988-07-01), Ballou et al.
patent: 4847795 (1989-07-01), Baker et al.
patent: 4964125 (1990-10-01), Kim
patent: 5099436 (1992-03-01), McCown et al.
Dunning, B., "Self-Learning Data-Base for Automated Fault Localization", Autotestcon '79, pp. 155-157.
Hewlett-Packard, Electronic Instruments and Systems 1979, pp. 147-149, 568, 569.
Aleksander, I., et al., "Guide to Pattern Recognition Using Random-Access Memories", Computers and Digital Techniques, Feb. 1979, vol. 2, No. 1, pp. 29-40.
Varghese, K., et al., "Simplified ATPG and Analog Fault Location Via a Clustering and Seperability Technique", IEEE Trans. on Circuits and Systems, vol. CAS-26, No. 7, Jul. 1979, pp. 496-504.
Pau, L., "Integrated Testing and Algorithms for Visual Inspection of Integrated Circuits", IEEE Trans. on Pattern Analysis and Machine Intelligence, vol. PAMI-5, No. 6, Nov. 1983, pp. 602-608.
Gordon, G. et al., "Hexadecimal Signatures Identify Troublespots in Microprocessor Systems", Electronics, Mar. 3, 1977, pp. 89-96.
Yau, S. et al., "Associative Processor Architecture-A Survey", Computing Surveys, vol. 9, No. 1, Mar. 1977, pp. 4-27.
Feucht, D., "Pattern Recognition: Basic Concepts and Implementations", Computer Design, Dec. 1977, pp. 57-68.
Pau, L., "Failure Detection Processes by an Expert System and Hybrid Pattern Recognition", Pattern Recognition Letters 2, Dec. 1984, pp. 419-425.
Psaltis, D. et al., "Optical Information Processing Based on an Associative-Memory Model of Neural Nets . . . ", Optics Letters, vol. 10, No. 2, Feb. 1985, pp. 98-100.
Soucek, B. et al., "Neural and Massively Parallel Computers", John Wiley & Sons, pub., 1988, pp. 345-354.
Batchelor, B. G., "Classification and Data Analysis in Vector Space", Pattern Recognition, Batchelor, B. G., ed., London, Plenum Press, pp. 67-116, 1978.
Oh, Se-Young, "A Pattern Recognition and Associative Memory Approach to Power System Security Assessment." IEE Transactions On Systems, Man And Cybernetics. vol. SMC-16, No. 1, Jan./Feb. 1986, pp. 62-72.
Stubberud, Allen R., "Failure Isolation Using An Associative Memory Algorithm." Proceedings of 25th Conference on Decision and Control, Dec. 1986, pp. 1113-1115.
Simpson, W. R. and Agre, J. R., "Adaptive Fault Isolation With Learning." ARINC Research Corporation, Annapolis, Md., 1983, pp. 331-335.
Koo, F. D. and Lee, G. W., "Isolating Failures Within VLSI Chips That Incorporate Signature Analysis and Set/Scan Techniques." International Test Conference, 1985, pp. 372-377.
Bedrosian, S. D., "The Role of Pattern Recognition in VLSI Testing." International Test Conference, 1986, pp. 750-754.
Anderson, T. E., "Adaptable Fault Dictionaries: An Application of Machine Learning." Department of Computer Science, University of Washington, Jan., 1988, pp. 1-4.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Adaptive fault identification system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Adaptive fault identification system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Adaptive fault identification system will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1270158

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.