Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2007-02-09
2008-12-09
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C438S017000
Reexamination Certificate
active
07463998
ABSTRACT:
A method of fabricating a semiconductor device so as to cause the device to have a desired transfer characteristic. Computations may be performed that predict a transfer characteristic of the semiconductor device for each of a plurality of different sets of values of available control parameters that may be used during the fabrication of the semiconductor device. A set of values of available control parameters that the computations predict will cause the semiconductor device to substantially provide the desired transfer characteristic may be identified, and the semiconductor device may be fabricated based on these identified values.
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McDermott Will & Emery LLP
Raymond Edward
University of Southern California
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