Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-01-31
2006-01-31
Assouad, Patrick J. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C455S423000, C375S224000, C340S003100, C702S179000
Reexamination Certificate
active
06993442
ABSTRACT:
One embodiment of the present invention separates the region of measurement space into a plurality of sub-regions and calculates a confidence, for reconstruction of an underlying signal within said space, corresponding to each of the sub-regions. This embodiment can then accept measurements from mobile measuring devices within said measurement space and store those measurements if they originate from devices in sub-regions having a confidence below an acceptable value.
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Eidson John C.
Hamilton Bruce
Kanevsky Valery
Agilent Technologie,s Inc.
Assouad Patrick J.
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