Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent
1988-02-03
1989-04-25
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
128 6, 356383, 356397, G02B 2326, G01B 1102
Patent
active
048252590
ABSTRACT:
The invention is an adapter tip 11 for supporting measuring indicia 22 on the forward end 12 of a conventional optical borescope 14 including focus adjustment means thereby permitting the substantially direct, physical measurement of internal surfaces and defects inside an object such as a pressure vehicle having an external opening therein when said measuring indicia 22 are positioned to coincide with a surface orb defect to be measured and simultaneously brought into focus with said surface or defect with said focus adjustment means.
REFERENCES:
patent: 3595220 (1968-08-01), Kawahara
patent: 3730632 (1973-05-01), Chikama
patent: 3817635 (1974-06-01), Kawahara
patent: 3819267 (1974-06-01), Kawahara
patent: 4078864 (1978-03-01), Howell
patent: 4558691 (1985-12-01), Okada
patent: 4588294 (1986-05-01), Siegmund
patent: 4660982 (1987-04-01), Okada
patent: 4727859 (1988-03-01), Lia
Adams Harold W.
Glenn Charles E. B.
Manning John R.
McGraw Vincent P.
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