Adapter for testing integrated circuits

Details Adapter for testing integrated circuits Adapter for testing integrated circuits

1994-11-03

1996-09-24

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, G01R 106

Patent

active

055594450

ABSTRACT:
A IC test adapter (100) for adapting the pin configuration of a chip carrier for use with test equipment. The IC test adapter (100) includes a case (101), printed circuit board (131), electrical contact pad(141), pin grid array (151) and bracket (161).

REFERENCES:
patent: 4862076 (1989-08-01), Renner et al.
patent: 5176525 (1993-01-01), Nierescher et al.
patent: 5177436 (1993-01-01), Lee
patent: 5363038 (1994-11-01), Love
patent: 5399982 (1995-03-01), Duller et al.

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