Adapter and test fixture for an integrated circuit device packag

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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Details

324158P, G01R 3102, G01R 1073

Patent

active

052026221

ABSTRACT:
A test fixture for a high pin count surface mounted IC device has a test head assembly connected to an adapter having electrically conductive elements that couple the output of the IC device to test points on the test head assembly. The test points are coupled to conductive pads on the test head assembly via conductive runs. The test head assembly conductive pads mate with conductive pad formed in the electrically conductive elements of the adapter. The conductive elements engage leads on the IC device providing conductive paths between the IC leads an the test points on the test head assembly. The test fixture is secured to the IC device by friction forces between the periphery of the IC device and the inner surface of the adapter. The test fixture or the adapter is usable as a low profile chip carrier by inverting the fixture or adapter and as a circuit board interconnect.

REFERENCES:
patent: 4724383 (1988-02-01), Hart
patent: 4816751 (1989-03-01), Seiichi et al.
patent: 4833404 (1989-05-01), Meyer et al.
patent: 4835469 (1989-05-01), Jones et al.
patent: 4935696 (1990-06-01), DiPerna
patent: 4959609 (1990-09-01), Prokopp et al.

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