Image analysis – Pattern recognition
Reexamination Certificate
2004-10-29
2010-12-28
Ahmed, Samir A (Department: 2624)
Image analysis
Pattern recognition
C382S155000, C382S160000, C382S190000, C382S220000, C704S256000
Reexamination Certificate
active
07860314
ABSTRACT:
A method and apparatus are provided for adapting an exponential probability model. In a first stage, a general-purpose background model is built from background data by determining a set of model parameters for the probability model based on a set of background data. The background model parameters are then used to define a prior model for the parameters of an adapted probability model that is adapted and more specific to an adaptation data set of interest. The adaptation data set is generally of much smaller size than the background data set. A second set of model parameters are then determined for the adapted probability model based on the set of adaptation data and the prior model.
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Acero Alejandro
Chelba Ciprian I.
Ahmed Samir A
Lee John W
Magee Theodore M.
Microsoft Corporation
Westman Champlin & Kelly P.A.
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