Adaptable end effector for atomic force microscopy based...

Details Adaptable end effector for atomic force microscopy based... Adaptable end effector for atomic force microscopy based...

2006-04-06

2008-08-05

Raevis, Robert R (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

07406859

ABSTRACT:
An improved nanomanipulation system is provided for performing nanomanipulation operations in relation to a sample surface. The system includes: an atomic force microscope having a probe for performing nanomanipulation operations on the sample surface, where the probe includes a cantilever having a layer of piezoelectric material; a position detector configured to ascertain deformation of the cantilever during a nanomanipulation operation; and an adaptable end effector controller adapted to receive data indicative of the deformation from the position detector and implements a control scheme based on the deformation data. The control scheme produces a control signal that is applied to the piezoelectric material of the cantilever, thereby maintaining the straight shape of the cantilever during the nanomanipulation operation.

REFERENCES:
patent: 6862924 (2005-03-01), Xi et al.
patent: 2006/0014202 (2006-01-01), Watanabe et al.
Hu et al, ?Method for separating single biological macromolecule Abstract, Sep. 29, 2004.

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