Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-04-24
2007-04-24
Barlow, Jr., John E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C324S426000, C324S425000, C324S398000, C439S762000, C702S063000, C702S064000
Reexamination Certificate
active
10909367
ABSTRACT:
An active tester for vehicle circuit evaluation includes a signal source for generating a dynamic signal, such as an AC current, for injecting to a circuit under test. The tester includes a data storage device for storing at least one test parameter and a data processor for processing data. In operation, the data processor controls to apply the dynamic signal to the separated points of the circuit via the first set of terminals. The response of the circuit under test to the applied dynamic signal is measured. The data processor determines a dynamic parameter of the circuit under test as a function of the dynamic signal and the response. The data process then generates a test result related to the characteristics of the circuit as a function of the at least one test parameter and the determined dynamic parameter. The test result is compared with specification values to determine whether the circuit under test works normally.
REFERENCES:
patent: 6313608 (2001-11-01), Vaeghese et al.
patent: 6329793 (2001-12-01), Bertness et al.
patent: 6771073 (2004-08-01), Henningson et al.
patent: 2003/0017753 (2003-01-01), Palmisano et al.
patent: 2003/0038637 (2003-02-01), Bertness et al.
patent: 2004/0036443 (2004-02-01), Bertness
U.S. Appl. No. 10/619,187, filed Jul. 15, 2003.
Brott Alejandro P.
Thibedeau Dennis
Barlow Jr. John E.
Kundu Sujoy
McDermott Will & Emery LLP
Snap-On Incorporated
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