Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-09-11
2007-09-11
Benson, Walter (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S691000, C073S766000, C702S042000
Reexamination Certificate
active
11592509
ABSTRACT:
A sensor circuit is provided that includes at least one pair of interconnected T-networks. Each pair has a first T-network including a first impedance serially connected to second impedance at a first junction and a first variable resistance sensor element connected to the first junction. Each pair also has a second T-network including a third impedance serially connected to a fourth impedance at a second junction and a second variable resistance sensor element connected to the second junction. The sensor circuit further includes an operational amplifier connected to the first T-network of a selected one of the at least one pair of T-networks and a constant voltage source connected to the second T-network of the selected T-network pair.
REFERENCES:
patent: 4345477 (1982-08-01), Johnson
patent: 5460050 (1995-10-01), Miyano
Mangalam Siva M.
Sarma Garimella R.
Benson Walter
He Amy
Hunton & Williams LLP
Tao of Systems Integration, Inc.
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