Active pulse monitoring in a chemical reactor

Chemistry: analytical and immunological testing – Rate of reaction determination

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C118S715000, C118S7230AN, C118S7230MP, C427S096800, C427S248100, C427S250000, C427S255230, C427S255280, C427S569000, C427S585000, C422S062000

Reexamination Certificate

active

07063981

ABSTRACT:
A method and apparatus for determining changes in a supply system, designed to supply repeated pulses of a vapor phase reactant to a reaction chamber is disclosed. One embodiment involves providing the reactant source, and a gas conduit to connect the reactant source to the reaction chamber, a valve positioned in communication with the reactant source such that switching of the valve induces vapor phase reactant pulses from the reactant source to the reaction chamber and a sensor positioned in communication with the reactant source and configured to provide a signal indicative of a characteristic parameter of the reactant pulse as a function of time. A curve is derived from the signal and the shape of the curve is monitored to determine changes in the curve shape over time during subsequent pulses.

REFERENCES:
patent: 4479845 (1984-10-01), Nisizawa et al.
patent: 5399881 (1995-03-01), Bozovic et al.
patent: 6038919 (2000-03-01), Schmitt et al.
patent: 6287965 (2001-09-01), Kang et al.
patent: 6613383 (2003-09-01), George et al.
patent: 6660660 (2003-12-01), Haukka et al.
Gruia, M. et al, Journal de Chimie Physique et de Physico-Chimie Biologique 1976, 73, 634-640, no month.
Dean, J. W. et al, Industrial & Engineering Chemistry Research 1988, 27, 1754-1759, no month.
Desai, N. S. et al, AlChE Symposium Series 1988, 84, 73-79, no month.
Lang, X. S. et al, Canadian Journal of Chemical Engineering 1991, 69, 1121-1125, no month.
Yu, M. L. et al, Materials Research Society Symposium Proceedings 1991, 204, 37-46, no month.
Davies, J. P. et al, nalytical Chemistry 1993, 65, 3004-3009, no month.
Aarik, J. et al, Journal of Crystal Growth 1996, 169, 496-502, no month.
Chowdhury, A. I. Et al, Journal of Vacuum Science & Technology, B 1997, 15, 127-132, no month.
Min, J.-S. et al, Japanese Journal of Applied Physics, Part 1 1998, 37, 4999-5004, no month.
Zhou, N. et al, Proceedings of SPIE 1999, 3792, 58-72, no month.
Dietz, N. et al, Materials Research Society Symposium Proceedings 2000, 591, 307-312, no month.
Pedrow, P. D. et al, Materials Research Society Symposium Proceedings 2000, 600, 325-331, no month.
Reath, M. et al, Proceedings—Institute of Environment Sciences 1993, 39TH(vol. 1), 119-123.
Tedder, L. L. et al, Journal of Vacuum Science & Technology, A 1996, 14, 267-270.
Gevelber, M. et al, Proceedings—Electrochemical Society 1996, 96-5, 157-162.
Weerts, W. L. M. et al, Surface Science 1996, 367, 321-339.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Active pulse monitoring in a chemical reactor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Active pulse monitoring in a chemical reactor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Active pulse monitoring in a chemical reactor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3698001

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.