Active matrix substrate inspecting device

Details Active matrix substrate inspecting device Active matrix substrate inspecting device

1991-12-19

1993-11-02

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

359 72, G01R 3102, G02F 1135

Patent

active

052587053

ABSTRACT:
A device and method for inspecting any fault in an active matrix substrate which includes a transparent conductive film on the substrate, an orientation film on the transparent conductive film, a polymer sheet opposite the orientation film with a liquid crystal sandwiched therebetween, a spacer for maintaining a space between the orientation film and the polymer sheet. An electrical modulation is observed in the liquid crystal by applying a voltage across the pixel electrode and the transparent conductive film.

REFERENCES:
patent: 4355278 (1982-10-01), Burns et al.
patent: 4538884 (1985-09-01), Masaki
Item 28p-ZD-6; Applied Physics Society; 1989 Autumn; p. 4.
IBM Technical Disclosure Bulletin, vol. 33, No. 2, Jul. 1990 pp. 130-131, "Liquid Crystal-Based Test Head".
Electronic Design, vol. 19, Sep. 13, 1967, pp. 71-79, Lauriente et al, "Liquid Crystals Plot The Hot Spots".
Patent Abstracts Of Japan, vol. 14, No. 98 (P-1011)22, Feb. 1990 JP-A-1 303 485 (Sharp), Dec. 7, 1989.

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