Active matrix substrate and inspecting method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257 72, 349 54, 349 55, H01L 2904, H01L 31036

Patent

active

057773483

ABSTRACT:
An active matrix substrate has a plurality of TFT elements provided in a matrix form, a gate line block and a source line block for supplying signals to the TFT elements, and a short circuit member for short-circuiting the gate line block and the source line block. The short circuit member includes a first segment and a second segment provided parallelly to each other between the gate line block and the source line block. The first segment changes from a short-circuiting state to an insulating state with laser radiation. The second segment either changes from an insulating state to a short-circuiting state with laser radiation, or has a higher electric resistance than the first segment in the short-circuiting state. Hence, destruction of insulating films and, hence, inadequate display are prevented even after inspection.

REFERENCES:
patent: 5223961 (1993-06-01), Ukai et al.
patent: 5473452 (1995-12-01), Shin

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Active matrix substrate and inspecting method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Active matrix substrate and inspecting method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Active matrix substrate and inspecting method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1208973

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.