Active-matrix substrate and electromagnetic wave detector

Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit

Reexamination Certificate

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C250S208100, C257S059000, C257S222000

Reexamination Certificate

active

07112778

ABSTRACT:
Pixel electrodes on an active-matrix substrate do not overlap signal lines and scanning lines, and satisfy a relation X1>Y1, where X1is the gap between the pixel electrodes and the signal lines, and Y1is the gap between the pixel electrodes and the scanning lines. As a result, a large-area and high-resolution electromagnetic wave detector is realized with an improved S/N ratio, even with an active-matrix array providing a large area for the charge collecting electrodes.

REFERENCES:
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patent: 6452241 (2002-09-01), Fukata et al.
patent: 6750476 (2004-06-01), Katayama
patent: 2002250937 (2002-09-01), None
Kasap et al.; “Direct-Conversion Flat-Panel X-Ray Image Sensors for Digital Radiography”; Proceedings of the IEEE, vol. 90, No. 4, Apr. 2002, pp. 591-604.
Zhao et al; “Investigation of Lag and Ghosting in Amorphous Selenium Flat-Panel X-Ray Detectors”; Proceedings of SPIE, vol. 4682, 2002, pp. 9-20.
Korean Office Action and English translation thereof mailed Aug. 26, 2005 in corresponding Korean application No. 10-2004-3989.

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