Active-matrix addressing substrate and method of fabricating...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Including integrally formed optical element

Reexamination Certificate

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Details

C438S022000, C438S024000, C438S048000, C257SE27001, C257SE21001

Reexamination Certificate

active

07465594

ABSTRACT:
An active-matrix addressing substrate improves the degradation of initial alignment of liquid-crystal molecules caused by the steps or level differences due to the pixel electrodes and/or the common electrode. The pixel electrodes are formed on or over the first insulating layer and the common electrode is formed on the second or third insulating layer. The second insulating layer has steps or level differences due to the pixel electrodes in their vicinities. The second insulating layer is made of a dielectric material having fluidity prior to hardening, e.g., an acrylic resin. The steps of the second insulating layer are relaxed, resulting in the gently sloping steps. The steps of an overlying alignment layer due to the common electrode slope gently as well. The thickness of the pixel electrodes, the thickness and inclination angle of the second insulating layer, and the thicknesses of the pixel and common electrodes are defined.

REFERENCES:
patent: 2003/0214027 (2003-11-01), Nishitani et al.
patent: 2002-323706 (2002-11-01), None
patent: 2004-62145 (2004-02-01), None
patent: 2004-302448 (2004-10-01), None
patent: 2005-195927 (2005-07-01), None

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