Active interconnects and control points in integrated circuits

Details Active interconnects and control points in integrated circuits Active interconnects and control points in integrated circuits

2007-07-10

2007-07-10

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S761010

Reexamination Certificate

active

11112795

ABSTRACT:
In various embodiments of the present invention, tunable resistors are introduced at the interconnect layer of integrated circuits in order to provide a for adjusting internal voltage and/or current levels within the integrated circuit to repair defective components or to configure the integrated circuit following manufacture. For example, when certain internal components, such as transistors, do not have specified electronic characteristics due to manufacturing defects, adjustment of the variable resistances of the tunable resistors included in the interconnect layer of integrated circuits according to embodiments of the present invention can be used to adjust internal voltage and/or levels in order to ameliorate the defective components. In other cases, the tunable resistors may be used as switches to configure integrated circuit components, including individual transistors and logic gates as well as larger, hierarchically structured functional modules and domains.

REFERENCES:
patent: 1913693 (1933-06-01), Wheeler
patent: 6407627 (2002-06-01), Martin
patent: 2003/0218514 (2003-11-01), Eckl et al.

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