Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-09-13
2005-09-13
Vu, David (Department: 2828)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S681000, C324S762010, C345S204000
Reexamination Certificate
active
06943564
ABSTRACT:
In an active-drive type pixel structure comprising at least TFT for control, TFT for drive, and a capacitor for charge retention, it can be easily inspected whether the functions of TFTs and the capacitor are normal or not. In an active-drive type pixel structure comprising TFT (Tr1) for control, TFT (Tr2) for drive, and a capacitor for charge retention, one terminal of a dummy load W for inspection is connected to a drain of the TFT for drive, and the other terminal of the load W is connected to a line3for inspection. By measuring an electric current Id obtained on the line3for inspection while changing a voltage supplied to a data line2a, it can be inspected whether the functions of TFTs and the capacitor are normal or not. The dummy load W is configured to be melted and cut by burning off the load W with a laser beam or by passing a predetermined electric current in the load W after completion of inspection.
REFERENCES:
patent: 6262589 (2001-07-01), Tamukai
patent: 6791350 (2004-09-01), Taguchi
patent: 2506840 (1996-04-01), None
Sakaguchi Shozaburo
Yoshida Takayoshi
Tohoku Pioneer Corporation
Vu David
Westerman Hattori Daniels & Adrian LLP
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