Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2005-08-02
2005-08-02
Noland, Thomas P. (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C250S306000
Reexamination Certificate
active
06923044
ABSTRACT:
A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever have an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of the invention, the tip and cantilever members have active components to produce kinetic action, thus facilitating the utility of the probe assembly in various SPM applications.
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General Nanotechnology LLC
Noland Thomas P.
Townsend and Townsend / and Crew LLP
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