Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2005-04-19
2005-04-19
Noland, Thomas P. (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
06880388
ABSTRACT:
A probe assembly suited for use in a scanning probe microscope (SPM) system includes a cantilever having an attachment to a main body portion. A suitable tip disposed at the free end of the cantilever provides various functions. According to various embodiments of the invention, an interference structure is provided to limit the range of deflection of the probe.
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