Active area planarization with self-aligned contacts

Fishing – trapping – and vermin destroying

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437235, 437245, H01L 21283

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active

048493775

ABSTRACT:
Molybdenum gate electrode material is provided with an upper layer of molybdenum nitride which acts to prevent deposition of source and drain contact metal by selective chemical vapor deposition (CVD). The nitride layer also provides an improved mask for ion implantation process steps. This results in an FET structure exhibiting a high degree of planarity which is desirable for multilevel device fabrication.

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patent: 4653428 (1987-03-01), Wilson et al.
Okabayashi et al, "A Mo-Nitride/Mo Gate MOS Structure", Extended Abstracts of Battery Division, The Electrochemical Society, Inc., Spring Meeting, Minneapolis, Minnesota, May 10-15, 1901, Abstract No. 302, pp. 753-755.
M. J. Kim et al., "Molybdenum Nitride Film Formation", Reprinted from Journal of the Electrochemical Society, vol. 30, No. 5, May 1983, pp. 1196-1200.
Pauleau, Y. et al., "Kinetics and Mechanism of Selective Tungsten Deposition by LPCVD", Journal of the Electrochemical Society, vol. 132, p. 2779 (1985).

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