Acquiring test data from an electronic circuit

Details Acquiring test data from an electronic circuit Acquiring test data from an electronic circuit

2008-07-08

2008-07-08

Nghiem, Michael P (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

11766145

ABSTRACT:
Methods, systems, and computer program products are disclosed for acquiring test data from an electronic circuit by mounting a probe adjacent to a capture point on an electronic circuit board, capturing by the probe an electronic signal of the electronic circuit, digitizing by the probe the captured signal, and transmitting by the probe the digitized signal from the probe through a data communications connection to a remote device. Acquiring test data from an electronic circuit also includes storing by the probe the digitized signal in the probe. Acquiring test data from an electronic circuit may include processing by the probe the digitized signal. Acquiring test data from an electronic circuit also may include synchronizing acquisition of test data by the probe with acquisition of test data by one or more other probes.

REFERENCES:
patent: 5144225 (1992-09-01), Talbot et al.
patent: 5349543 (1994-09-01), Buliszyn et al.
patent: 2003/0038626 (2003-02-01), Carrington et al.
patent: 2006/0277384 (2006-12-01), Yagawa et al.
patent: 2007/0168147 (2007-07-01), Cannon et al.

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