Measuring and testing – Vibration – By mechanical waves
Patent
1982-07-06
1984-07-17
Birmiel, Howard A.
Measuring and testing
Vibration
By mechanical waves
73642, G01N 2900
Patent
active
044598521
ABSTRACT:
An acoustic microscope using a line-focus acoustic beam is disclosed. The line-focus acoustic beam is generated by an acoustic transducer head having an acoustic transducer electrode applied on a flat end surface of a sapphire rod, in the opposite end surface is formed a cylindrical concave surface. The acoustic transducer head is arranged fixedly above a mechanical stage on which a specimen is placed. The mechanical stage is movable in a Z axis, i.e. an axis of the line-focus acoustic beam and is also rotatable about the Z axis. By moving the stage in the Z-axis, a V(z) curve is obtained and a phase velocity of a leaky surface-acoustic wave is calculated from a repetition period of the V(z) curve. Then the V(z) curve measurement is repeated while the stage is rotated, and it is possible to obtain anisotropies of the specimen expressed by a relation between the rotational angle and the phase velocity of the leaky surface-acoustic wave.
REFERENCES:
patent: 3663842 (1972-05-01), Miller
patent: 4378699 (1983-04-01), Wickramasinghe
"Linearly Focused Acoustic Beams for Acoustic Microscopy", Kushibiki et al, Electronics Letters, vol. 17, No. 15, Jul. 1981, pp. 520-522.
Applied Physics Letters, vol. 34, No. 3, Feb. 1, 1979 pp. 179-181.
IEEE 1981 Ultrasonics Symposium, pp. 552-556.
Chubachi Noriyoshi
Kushibiki Jun-ichi
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