Acoustic method and device for localization of defects in materi

Details Acoustic method and device for localization of defects in materi Acoustic method and device for localization of defects in materi

1990-04-23

1992-05-26

Chapman, John E.

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

73643, G01N 2914

Patent

active

051156814

ABSTRACT:
The method according to the invention consists, in a first step, in studying the acoustic response of a piece P by recording, with acoustic sensors (1, 2, 3, 4), signals emitted by a calibrated acoustic emitter (5), from a succession of predetermined mark points defining a grid on the surface of the piece, while the latter is unstressed. In a second step, the piece is stressed and the acoustic signals coming from acoustic events created by this stressing of the piece are recorded. Processing of the propagation times and of the amplitudes of the acoustic waves thus recorded during these two steps allows identification of the position and size of structural defects in the material constituting the piece P.

REFERENCES:
patent: 4033179 (1977-07-01), Romrell
patent: 4352167 (1982-09-01), Hashimoto et al.
patent: 4354388 (1982-10-01), Diepers et al.
patent: 4586378 (1986-05-01), Izumi et al.
patent: 4641526 (1987-02-01), Izumi et al.
patent: 4742713 (1988-05-01), Abe et al.
patent: 4979124 (1990-12-01), Sachse et al.

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