Measuring and testing – Vibration – By mechanical waves
Patent
1983-11-17
1985-08-13
Ciarlante, Anthony V.
Measuring and testing
Vibration
By mechanical waves
73799, G01N 2904
Patent
active
045342199
ABSTRACT:
An acoustic crack detection method and device in which an impact is produced between an actually tested metal piece and an anvil. This impact generates an acoustic wave formed of a plurality of components, one of these wave components being produced by vibrations of the metal piece and having a frequency indicating a cracked or uncracked state of this piece. A microphone senses the acoustic wave generated by the impact and a measuring circuit receives the signal from the microphone for measuring the energy, within a predetermined time gate and within a predetermined frequency bandwidth, of the wave component of interest. The measured energy is compared with a reference level in order to determine if the actually tested metal piece is cracked or not. Of course, the anvil is designed so that its vibrations produced by the impact generate no wave component at a frequency included within the predetermined frequency bandwidth, whereby the crack detection is not disturbed by any acoustic wave component generated by the anvil. The detecting device may be used in an apparatus for sorting cracked and uncracked metal pieces.
REFERENCES:
patent: 3284192 (1966-11-01), Larson et al.
patent: 4020678 (1977-05-01), Laue
patent: 4091660 (1978-05-01), Yanagi
patent: 4122723 (1978-10-01), Levizzari et al.
patent: 4285241 (1981-08-01), Smith et al.
patent: 4375762 (1983-03-01), Yanagisawa et al.
Bussiere Jean F.
Nadeau Francois
Vaudreuil Ghislain
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