Achromatic self-referencing interferometer

Details Achromatic self-referencing interferometer Achromatic self-referencing interferometer

1992-07-17

1994-04-19

Housel, James C.

Optics: measuring and testing

By particle light scattering

With photocell detection

356353, G01B 902

Patent

active

053050746

ABSTRACT:
A self-referencing Mach-Zehnder interferometer for accurately measuring laser wavefronts over a broad wavelength range (for example, 600 nm to 900 nm). The apparatus directs a reference portion of an input beam to a reference arm and a measurement portion of the input beam to a measurement arm, recombines the output beams from the reference and measurement arms, and registers the resulting interference pattern ("first" interferogram) at a first detector. Optionally, subportions of the measurement portion are diverted to second and third detectors, which respectively register intensity and interferogram signals which can be processed to reduce the first interferogram's sensitivity to input noise. The reference arm includes a spatial filter producing a high quality spherical beam from the reference portion, a tilted wedge plate compensating for off-axis aberrations in the spatial filter output, and mirror collimating the radiation transmitted through the tilted wedge plate. The apparatus includes a thermally and mechanically stable baseplate which supports all reference arm optics, or at least the spatial filter, tilted wedge plate, and the collimator. The tilted wedge plate is mounted adjustably with respect to the spatial filter and collimator, so that it can be maintained in an orientation in which it does not introduce significant wave front errors into the beam propagating through the reference arm. The apparatus is polarization insensitive and has an equal path length configuration enabling measurement of radiation from broadband as well as closely spaced laser line sources.

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M. Feldman, D. J. Mockler, R. E. English Jr., J. L. Byrd, and J. T. Salmon, "Self-referencing Mach-Zehnder Interferometer As A Laser System Diagnostic", Active and Adaptive Optical Systems, Mark A. Ealey, Editor, Proc. SPIE 1542, pp. 490-501 (1991).

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