Optics: measuring and testing – By light interference – Having light beams of different frequencies
Patent
1998-04-30
2000-12-05
Turner, Samuel A.
Optics: measuring and testing
By light interference
Having light beams of different frequencies
356517, G01B 902
Patent
active
061574589
ABSTRACT:
An improved interferometric system with reduced air turbulence error. The system includes an optical retarder that functions as a quarter wave plate for two harmonically related frequencies. The retarder may be formed by a pair of quartz disks cut so that the C axis lie in the plane of the disk and are oriented orthogonally relative to each other.
REFERENCES:
patent: 5321502 (1994-06-01), Matsumoto et al.
patent: 5404222 (1995-04-01), Lis
patent: 5748313 (1998-05-01), Zorabedian
patent: 5838485 (1998-11-01), De Groot
Spindler & Hoyer catalog, pp. S15-S18, Jul. 1988.
Ealing Electro-Optics catalog, pp. K71-K72, Jul. 1991.
Agilent Technologies
Turner Samuel A.
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