Achromatic optical interferometer, of the trilateral shift type

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

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356358, G01B 902

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active

056064179

ABSTRACT:
A device for analyzing the wave surface of a light beam has an entry lens which defines a reference plane, optically conjugate with the plane in which the wave surface of the light beam is analysed. A bidimensional meshed lattice is placed in this reference plane, perpendicularly to the beam. The different sub-beams, due to the different orders of diffraction, are focused jointly by a first lens, in an intermediate focal plane, in the vicinity of which a mask selects, from the sub-beams, those which relate to at least three distinct orders of diffraction. A second lens takes the selected sub-beams to a nil-sensitivity plane, conjugate with the plane of the lattice. An interference image is observed in a working plane, situated at a chosen distance from the nil-sensitivity plane. The device can be characterized as an improved achromatic optical interferometer, of the trilateral shift type.

REFERENCES:
patent: 4413909 (1983-11-01), Pohle
patent: 4518854 (1985-05-01), Hutchin
patent: 4670646 (1987-06-01), Spivey
patent: 4707137 (1987-11-01), Lee
patent: 5159407 (1992-10-01), Chuanside
Jerome Primot, "Three-wave lateral shearing interferometer", Applied Optics, vol. 32. No. 31, Nov. 1, 1993, pp. 6242-6249.
Francois Roddier, "Variations on a Hartmann theme", Optical Engineering, vol. 29 No. 10, Oct. 1990, pp. 1239-1242.

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