Accurate testing of temperature measurement unit

Details Accurate testing of temperature measurement unit Accurate testing of temperature measurement unit

2006-04-18

2006-04-18

Nguyen, Linh V. (Department: 2819)

Coded data generation or conversion

Converter compensation

Temperature compensation

C341S144000

Reexamination Certificate

active

07030793

ABSTRACT:
Various embodiments of a method and apparatus for simulating temperature characteristics of a diode are disclosed. The output of a diode simulator may not depend upon its ambient temperature. Therefore, it may be used to calibrate a temperature measurement unit at any ambient temperature within its operational range regardless of the temperature to which the temperature measurement unit is to be calibrated. Even if the ambient temperature of the facility in which the calibration is performed varies during the calibration procedure, the output of the diode simulator may remain constant. These characteristics of the diode simulator may allow for calibration of a temperature measurement unit in significantly less time than by using prior art methods, which include the requirement to tightly control the temperature of one or more system components.

REFERENCES:
patent: 3672215 (1972-06-01), Stout et al.
patent: 3679992 (1972-07-01), Yerman
patent: 4228684 (1980-10-01), Templin
patent: 4340882 (1982-07-01), Maio et al.
patent: 4636092 (1987-01-01), Hegyi
patent: 4958155 (1990-09-01), Gulczynski
patent: 5195827 (1993-03-01), Audy et al.
patent: 5419637 (1995-05-01), Frye et al.
patent: 5982221 (1999-11-01), Tuthill
patent: 6008685 (1999-12-01), Kunst
patent: 6097239 (2000-08-01), Miranda, Jr. et al.
patent: 6246353 (2001-06-01), Elliott et al.
patent: 6265857 (2001-07-01), Demsky et al.
patent: 6480127 (2002-11-01), Aslan
patent: 6554469 (2003-04-01), Thomson et al.
patent: 6554470 (2003-04-01), Zhang et al.
patent: 6933867 (2005-08-01), Honda
patent: 6956516 (2005-10-01), Furuichi
patent: 2004/0227651 (2004-11-01), Furuichi
patent: 003637520 (1988-05-01), None
patent: 000498799 (1991-05-01), None
patent: 000741860 (1996-11-01), None
patent: 002292221 (1996-02-01), None
Shen-Whan Chen; Trung Duong; Min-Yih Luo; “Channel Temperature Measurement Using Pulse-Gate Method,” IEEE Transactions on Microwave Theory and Techniques, vol. 47, No. 3, Mar. 1999, pp. 362-365.
Kaliyugavaradan, S.; Sankaran, P.; Murti, V.G.K.; “Application Of Reciprocal Time Generation Technique To Digital Temperature Measurement,” IEEE Transactions on Instrumentation and Measurement, vol. 43, No. 1, Feb. 1994, pp. 99-100.
Cao Hui; Huang Junnai; “Circuit Design and Implementation for Digital Temperature and Humidity Measurement and Control,” ASIC, 2001. Proceedings. 4th International Conference on Oct. 23-25, 2001, pp. 502-505.
Michael P. Timko, “A Two-Terminal IC Temperature Tranducer”, IEEE JSSC vol. SC-11, No. 6, Dec. 1976, pp. 784-788.
Szajda et al. “A Low Noise, High Resolution Silicon Temperature Sensor”, IEEE JSSC, vol. 31, No. 9, Sep. 1996, pp. 1308-1313.

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